Last edited by Migore
Sunday, July 19, 2020 | History

2 edition of Investigation of the sampling volume in secondary ion microanalysis found in the catalog.

Investigation of the sampling volume in secondary ion microanalysis

H. Mai

Investigation of the sampling volume in secondary ion microanalysis

by H. Mai

  • 187 Want to read
  • 19 Currently reading

Published by Akademie der Wissenschaften der DDR, Zentralinstitut für Festkörperphysik und Werkstofforschung in Dresden .
Written in English

    Subjects:
  • Secondary ion mass spectrometry.,
  • Sampling.

  • Edition Notes

    Bibliography: v. 1, p. 53-57.

    StatementH. Mai.
    SeriesWissenschaftliche Berichte ;, Heft 33, Wissenschaftliche Berichte (Akademie der Wissenschaften der DDR. Zentralinstitut für Festkörperphysik und Werkstofforschung) ;, Heft 33, etc.
    Classifications
    LC ClassificationsQD96.S43 M35 1986
    The Physical Object
    Paginationv. <1 > :
    ID Numbers
    Open LibraryOL2081170M
    LC Control Number88118326

    In addition, for the specific case of aqueous corrosion studies, the electron beam that is used as the imaging probe has two principle detrimental effects: first, it may charge the sample through direct electron transfer, which could lead to a change in the temperature of the solution and/or sample (Cazaux, ; Zheng et al., ); second. Secondary Ion Mass Spectrometry (SIMS) involves bombarding a sample with a high-energy ion beam, which sputters atoms, molecules and electrons from the sample surface. Ionized species (secondary ions) are extracted to a mass spectrometer, sorted according to their energy and their mass-to-charge ratio, and counted.

    Furthermore, the analytical setup is simplified to a sampling source and detector, i.e. without the need for a secondary ionization or excitation source as in some state-of-the-art analytical systems. In this review, fundamental aspects of X-ray laser desorption and ablation are discussed, and a survey of the available literature is presented. The book addresses various aspects of the topic in six chapters. Sample Preparation Handbook for Transmission Electron Microscopy: Methodology (Volume 1) Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Daniele Laub, , pp, hardcover, ISBN

      Since isotopic ratios of H, C, and N are sensitive indicators for determining extraterrestrial organics, we have measured these isotopes of Hayabusa category 3 organic samples of RB-QD, RA-QD, and RB-QD with ion imaging using a NanoSIMS ion microprobe. All samples have H, C, and N isotopic compositions that are terrestrial within errors (approximately ±50‰ . Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. Current instrumentation provides a powerful combination of capabilities for molecular detection and trace element determination, depth profiling, imaging in two and three.


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Investigation of the sampling volume in secondary ion microanalysis by H. Mai Download PDF EPUB FB2

Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions. The mass/charge ratios of these secondary ions are measured with a mass spectrometer to determine the elemental, isotopic, or molecular composition of Related: Fast atom bombardment, Microprobe.

X-ray microanalysis is an assay technique to measure the elements at greater than % rather than a trace element analysis technique. b Secondary Ion Mass Spectrometry. Secondary ion mass spectrometry (SIMS) can be used for both elemental surveys and isotopic analysis of.

1. Introduction. In archaeology, oxygen isotope variation in bone and tooth bioapatite, and hence consumed water, has been used to record geographic relocations (Koon and Tuross, ), identify outsiders (Dupras and Schwarcz, ), and illuminate ancient life histories (White et al., ).More refined sampling techniques have revealed temporal changes across sequentially Cited by: 2.

Scanning helium ion microscope: Distribution of secondary electrons and ion channeling. Journal of Surface Investigation. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, Vol. 4, Issue. 5, p. The secondary ion mass spectrometer (SIMS) has proven useful for determining both the atomic and molecular composition of solid surfaces.

SIMS is based upon bombarding the surface of the sample with a beam of 5–20 KeV ions, such as Ar +, CS +, N 2 +, and O 2 +. In order to assist you with providing an appropriate amount of sample, please refer to the table below. If the test you require does not appear on this list, or you do not have the sample volume required, please feel free to give us a call on (08) or email [email protected] When you would like to send your samples to us for analysis, please fill in a MAQR02 General Analysis Request form – Microanalysis Australia v form to include with your sample.

If you have never sent a sample to us before, please also fill in a Customer Registration Form and email it to us at [email protected] To deliver your samples, use a courier, Australia Post, or bring.

A detailed structural study of b.c.c. stainless steel (SS) films prepared by ion beam sputtering of a commercial grade SS is presented.

The as-sputtered state is first studied using several techniques, namely transmission electron microscopy and X-ray microanalysis, secondary ion mass spectrometry, X-ray photoelectron spectroscopy, conversion electron Mössbauer spectroscopy Cited by:   International Journal of Mass Spectrometry and Ion Physics, 23 () 8R3 Elsevier Scientific Publishing Company, Amsterdam -Printed in The Netherlands - FEFFECT OF ENERGY SELECTION ON QUANTITATIVE ANALYSIS IN SPONDARY ION OCOANALYSIS - IAN O LE 1, IAN D_ HUTCOON 2, TODD N.

SOLBERG 1, JOSEPH V_ SMITH I and ROBERT N_. For lateral spatial resolutions above 1 μm, secondary ion mass spectrometry (SIMS) has often proven satisfactory at concentration levels down to 10−6 mass fraction (1 p.p.m.) and lower.

Ionoluminescence (IL) is the emission of light from a material due to excitation by an ion beam. In this work, a helium ion microscope (HIM) has been used in conjunction with a luminescence detection system to characterize IL from materials in an analogous way to how cathodoluminescence (CL) is characterized in a scanning electron microscope (SEM).

Linking Microstructure and Nanochemistry in Human Dental Tissues - Volume 18 Issue 3 - Vesna Srot, Birgit Bussmann, Ute Salzberger, Christoph T.

Koch, Peter A. van Aken. This work opens the door for comprehensive investigation and optimal design of dose efficient scanning strategies and real-time adaptive inference and control of e-beam induced atomic fabrication. A New and Unexpected Spatial Relationship Between Interaction Volume and Diffraction Pattern in Electron Microscopy in Transmission.

Cambridge Core - Microscopy and Microanalysis - Volume 14 - Issue 4. A method for phase analysis, similar to the Rietveld method in X-ray diffraction, was not developed for electron diffraction (ED) in the transmission electron microscope (TEM), mainly due to the dynamic nature of ED.

The secondary electron (SE) mode collects low-energy secondary electrons originating within a few nanometers from the sample surface [24]. This mode results in images with a well-defined, three. Several homogeneous carbon-boronitride (BCN) coatings were produced with cold-wall chemical vapor deposition varying the temperature of the deposition.

Li-ion batteries have seen extensive investigation over the last two decades as the basis for high power density secondary sources for electric vehicles and storage devices for the smart grid. To answer these challenges, creating high performance cathode materials is a prerequisite [1], [2], [3].

Request PDF | Focused ion beam milling: A method of site-specific sample extraction for microanalysis of Earth and planetary materials | Argon ion milling is the conventional means by which.

In addition, simultaneously acquired further secondary ions at a mass resolution of R = shed light on the sample composition. In summary, the investigation shows that μ-XRF is highly suitable to identify relevant tissue regions for subsequent high resolution ToF-SIMS 3D microanalysis.

Focused ion beam nanotomography (FIB-nt) is a novel method for high resolution three-dimensional (3D) imaging. In this investigation we assess the methodological parameters related to image acquisition and data processing that are critical for obtaining reproducible microstructural results from granular materials and from complex suspensions.

David A. Reinhard's 57 research works with citations and 2, reads, including: Atom Probe Tomography of Phalaborwa Baddeleyite and Reference Zircon .The most common mode of this technique relies on the detection of secondary electrons scattered from the sample surface after the electrons of a high energy electron beam interact with its atoms.Citrus leaves accumulate large amounts of calcium that must be compartmented effectively to prevent stomatal closure by extracellular Ca2+ and interference with Ca2+-based cell signaling pathways.

Using x-ray microanalysis, the distribution of calcium between vacuoles in different cell types of leaves of rough lemon (Citrus jambhiri Lush.) was investigated.